Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
BURN-IN
Semiconductor Testing
Chip Probing
IC Functional Testing
+886-3-327-9600
68,Hwa-Ya 1st Road, Hwa-Ya Technology Park, Taoyuan Hsien 333, Taiwan
333桃園市龜山區華亞科學園區華亞一路68號
333桃園市龜山區華亞科學園區華亞一路68號