About
Test Services
Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
Burn-in
Semiconductor Testing
Chip Probing
IC Functional Testing
Advantage
News
Contact
Testar 晶測電子
News
New VCSEL Prober
December 21, 2018
VCSEL / Photodiode Chip Burn-in / Lot Acceptance Test
December 01, 2018
Latest Model of Chroma Automatic Visual Inspection Machine 7940
October 01, 2018
+886-3-327-9600
testarservice@testar.com.tw
68,Hwa-Ya 1st Road, Hwa-Ya Technology Park, Taoyuan Hsien 333, Taiwan
333桃園市龜山區華亞科學園區華亞一路68號
Quick Links
About Testar
Test Services
Testar Advantage
Testar News
Privacy Policy
Follow us on
About
Test Services
Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
Burn-in
Semiconductor Testing
Chip Probing
IC Functional Testing
Advantage
News
Contact
