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Test Services
Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
Burn-in
Semiconductor Testing
Chip Probing
IC Functional Testing
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VCSEL Testing
LED Total Power Test System
LED Die Probing
Testar 晶測電子
Test Services
Chip Probing
Key Feature
Up to 6" wafer
Wide range and precise temperature control
Support both pulse and CW operation
Support LIV, Far-Field, Near-Field
Spectrum measurement
Light responsivity test
Calibration effectiveness and IV characteristic managed by MES
Request For Quote
+886-3-327-9600
testarservice@testar.com.tw
68,Hwa-Ya 1st Road, Hwa-Ya Technology Park, Taoyuan Hsien 333, Taiwan
333桃園市龜山區華亞科學園區華亞一路68號
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About
Test Services
Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
Burn-in
Semiconductor Testing
Chip Probing
IC Functional Testing
Advantage
News
Contact