Chip Probing

KEY FEATURE

  • References: ISO/IEC standards
  • Up to 6" wafer
  • Wide range and precise temperature control
  • Support both pulse and CW operation
  • Support multisite testing
  • Support LIV, Far-Field, Near-Field
  • Calibration effectiveness and IV characteristic managed by MES

 +886-3-327-9600

testarservice@testar.com.tw

68,Hwa-Ya 1st Rd.,

Hwa-Ya Technology Park,

Taoyuan Hsien 333, Taiwan

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